Manufacturer: Institute of Electrical & Electronics Enginee
Number of Items: 1
Binding: Hardcover
Author: Texas) International Conference on Innovative Systems in Silicon (8th : 1996 : Austin
Publisher: Institute of Electrical & Electronics Enginee
Dewey Decimal Number: 621
Publication Date: 1996-10
Reading Level: 391
Description: This conference provides a broad view of the diverse arena of innovation. From this broad perspective, a wide variety of novel approaches under investigation and under development is assessed. Topics presented at this conference combine to provide a rich tapestry of capabilities through which VLSI technologies can be extended in new directions. The focus is on many aggressive extensions of circuit and packaging technologies which are addressing limitations of speed, size, and architectural capabilities.
Manufacturer: Institute of Electrical & Electronics Enginee
Number of Items: 1
Binding: Paperback
Author: IEEE Computer Society::IEEE
Publisher: Institute of Electrical & Electronics Enginee
Edition: 1999
Dewey Decimal Number: 621
Publication Date: 1999-01
Reading Level: 375
Description: These proceedings cover: yield; testing techniques; built-in self-test architectures; fault modelling and simulation; design for testing; self-checking processing units and systems; self-checking memories and interconnections; diagnosis; and reconfiguration.
