SHOPPING HOME
      <<<   YOU ARE HERE

Shopper's Delight

The Books Store


 
Search Results:

Displaying records 131 through 140 of 460
First      Previous
Next      Last

 

  Vlsi Test Symposium (Vts 2001): 19th IEEE Symposium

 
Vlsi Test Symposium (Vts 2001): 19th IEEE Symposium under The Books Store
Price: $160.00
Sale: $160.00
 
Manufacturer: Institute of Electrical & Electronics Enginee
Number of Items: 1
 
 
Binding: Paperback
Author: India) International Conference on VLSI Design (14th : 2001 : Bangalore
Publisher: Institute of Electrical & Electronics Enginee
Dewey Decimal Number: 621
Publication Date: 2001-07
Reading Level: 414
 
Description: Topics include: BIST techniques; diagnosis methods; test data compression; synthesis and design for testability; diagnosis and verification ATPG; defect analysis and IDDx diagnosis; SoC testing; self-test techniques; memory diagnosis; novel ATPG techniques; fault modelling and BIST evaluation.

 

  1995 IEEE Symposium on Vlsi Circuits: Digest of Technical Papers : June 8-10, 1995/Kyoto

 
1995 IEEE Symposium on Vlsi Circuits: Digest of Technical Papers : June 8-10, 1995/Kyoto under The Books Store
Price: $90.00
Sale: $90.00
 
Manufacturer: Institute of Electrical & Electronics Enginee
Number of Items: 1
 
 
Binding: Paperback
Author: IEEE Solid-State Circuits Council
Publisher: Institute of Electrical & Electronics Enginee
Dewey Decimal Number: 621
Publication Date: 1995-09
Reading Level: 132
 

 

  1996 Proceedings: Eighth Annual IEEE International Conference on Innovative Systems in Silicon, Austin, Texas, USA

 
1996 Proceedings: Eighth Annual IEEE International Conference on Innovative Systems in Silicon, Austin, Texas, USA under The Books Store
Price: $92.00
Sale: $69.95
 
Manufacturer: Institute of Electrical & Electronics Enginee
Number of Items: 1
 
 
Binding: Hardcover
Author: Texas) International Conference on Innovative Systems in Silicon (8th : 1996 : Austin
Publisher: Institute of Electrical & Electronics Enginee
Dewey Decimal Number: 621
Publication Date: 1996-10
Reading Level: 391
 
Description: This conference provides a broad view of the diverse arena of innovation. From this broad perspective, a wide variety of novel approaches under investigation and under development is assessed. Topics presented at this conference combine to provide a rich tapestry of capabilities through which VLSI technologies can be extended in new directions. The focus is on many aggressive extensions of circuit and packaging technologies which are addressing limitations of speed, size, and architectural capabilities.

 

  14th Annual IEEE International Asic/Soc Conference: Proceedings (IEEE Conference Proceedings)

 
14th Annual IEEE International Asic/Soc Conference: Proceedings (IEEE Conference Proceedings) under The Books Store
Price: $168.00
Sale: $168.00
 
Manufacturer: Ieee
 
 
Binding: Paperback
Author: IEEE International ASIC
Publisher: Ieee
Dewey Decimal Number: 621
Publication Date: 2001-12
Reading Level: 450
 
Description: This volume contains the conference proceedings of the 2001 IEEE International ASIC Conference and Exhibition.

 

  Vlsi Design for (Self- Testability)

 
Vlsi Design for (Self- Testability) under The Books Store
 
Manufacturer: CRC
 
 
Binding: Loose Leaf
Author: Andrzej Krasniewski
Publisher: CRC
Publication Date: 1996-01-01
 

 

  1995 IEEE Tencon: Proceedings : November 6-10, 1995 Hong Kong Convention and Exhibition Centre Hong Kong

 
1995 IEEE Tencon: Proceedings : November 6-10, 1995 Hong Kong Convention and Exhibition Centre Hong Kong under The Books Store
Price: $126.00
Sale: $126.00
 
Manufacturer: Institute of Electrical & Electronics Enginee
Number of Items: 1
 
 
Binding: Paperback
Author: TENCON (1995 : Hong Kong)
Publisher: Institute of Electrical & Electronics Enginee
Dewey Decimal Number: 621.381
Publication Date: 1996-03
Reading Level: 498
 

 

  VLSI Neural Network Systems (Japanese Technology Reviews Section B : Computers and Communications, Vol 2 No 1)

 
VLSI Neural Network Systems (Japanese Technology Reviews Section B : Computers and Communications, Vol 2 No 1) under The Books Store
 
Manufacturer: Routledge
Number of Items: 1
 
 
Binding: Paperback
Author: Yuzo Hirai
Publisher: Routledge
Edition: 1
Dewey Decimal Number: 620
Publication Date: 1992-01-01
Reading Level: 130
 
Description: VLSI Neural Network Systems introduces state-of-the-art research for implementing neural networks in electronic circuits, particularly digital circuits, and describes the major applications of neural networks. this book reviews the development of neural networks as a prerequisite to obtaining real-time performance. The functions of single neurons are characterized, and special consideration is paid to key functions required of neural chips (input/output representation, synaptic multiplication, spatial summations, temporal summations and output functions) and to the various methods used to realize these key components in electronic circuits. Current research on hardware implementation is surveyed. finally, the author provides a detailed description of his own research on the development of a new PDM digital neural chip and the performance of a PDM digital netowrk system.

 

  Progress in Computer Aided Vlsi Design: Tools (Progress in Computer-Aided V L S I Design)

 
Progress in Computer Aided Vlsi Design: Tools (Progress in Computer-Aided V L S I Design) under The Books Store
Price: $34.95
Sale: $32.95
 
Manufacturer: Ablex Publishing Corporation
Number of Items: 1
 
 
Binding: Hardcover
Publisher: Ablex Publishing Corporation
Dewey Decimal Number: 621.395
Publication Date: 1990-02
Reading Level: 3
 
Description: These volumes review late 1980s/early 1990s state-of-the-art developments in computer-aided design and analysis techniques. Contributions from researchers and practitioners include discussions of parallel algorithms and fundamental operations in cryptography, systolic arrays and pipelined designs.

 

  1996 IEEE Vlsi Test Symposium: April 28-May 1, 1996 Princeton, New Jersey

 
1996 IEEE Vlsi Test Symposium: April 28-May 1, 1996 Princeton, New Jersey under The Books Store
Price: $100.00
Sale: $100.00
 
Manufacturer: Institute of Electrical & Electronics Enginee
Number of Items: 1
 
 
Binding: Paperback
Publisher: Institute of Electrical & Electronics Enginee
Dewey Decimal Number: 621.3950287
Publication Date: 1996-04
Reading Level: 510
 

 

  Tenth International Conference on Vlsi Design: January 4-7, 1997 Hyderabad, India : Proceedings

 
Tenth International Conference on Vlsi Design: January 4-7, 1997 Hyderabad, India : Proceedings under The Books Store
 
Manufacturer: Institute of Electrical & Electronics Enginee
Number of Items: 1
 
 
Binding: Paperback
Author: India) International Conference on Vlsi Design 1997 (Hyderabad
Publisher: Institute of Electrical & Electronics Enginee
Dewey Decimal Number: 621.395
Publication Date: 1997-01
Reading Level: 566
 

First      Previous
Next      Last
Displaying records 131 through 140 of 460