Manufacturer: Institute of Electrical & Electronics Enginee
Number of Items: 1
Binding: Paperback
Author: IEEE Electron Devices Society
Publisher: Institute of Electrical & Electronics Enginee
Edition: 2000
Dewey Decimal Number: 621
Publication Date: 2000-07-15
Reading Level: 249
Description: These conference prodeedings cover such topics as: copper interconnects; novel devices; high-K dielectrics; process technology; embedded DRAM; gate electrode engineering; DRAM cells; gate oxide scaling and reliability; DRAM capacitors; and high performance RF.
Description: These volumes review late 1980s/early 1990s state-of-the-art developments in computer-aided design and analysis techniques. Contributions from researchers and practitioners discuss parallel algorithms and fundamental operations in cryptography, systolic arrays, pipelined designs, CAD/CAM applications, semicustom arrays, VLSI design using Caeser and MOSIS, a CMOS 16 x 16 parallel multiplier, design and simulation of a reduced instruction set computer, and more.
Manufacturer: Advanced and Applied Technologies Institute
Number of Items: 1
Binding: Paperback
Author: International Symposium on Neuro-Fuzzy Systems
Publisher: Advanced and Applied Technologies Institute
Dewey Decimal Number: 006.32
Publication Date: 1997-04
Reading Level: 150
Description: This is a first conference describing advances in designing and using integrated circuits in control system. The application of neural networks on VLSI is explored. The Use of fuzzy logic in integrated circuit product controllers is explored.
